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X-Ray Flourescence Analysis

X-Ray Flourescence Analysis

X-Ray Fluorescence (XRF) analysis is a quick, simple method used to determine a material’s chemical composition. XRF is a non-destructive test, which has the ability to test materials with little or no surface preparation.

Materials are exposed to short-wavelength X-rays, creating ionization of their component atoms. Ionization consists of the ejection of one or more electrons from the atom and may occur if the atom is exposed to radiation with an energy greater than its ionization energy. X-rays can be energetic enough to expel tightly held electrons from the inner orbitals of the atom. The removal of an electron makes the electronic structure of the atom unstable, and electrons in higher orbitals move into the lower orbital to fill the hole left behind causing energy to be released in the form of a photon. The energy of the photon is equal to the energy difference of the two orbitals involved. Thus, the material emits radiation, which has an energy characteristic of the atoms present.

Common Standards:

American Society for Nondestructive Testing

NDE-60.18

American Society for Testing & Materials

ASTM B568, ASTM E1085, ASTM E1476, ASTM E1621, ASTM E322, ASTM E539, ASTM E572

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